Email:
hieuchuan3d@gmail.com
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
Compatible observation methods:
CFI60-2 series offers higher NA and longer working distances than ever before.
